Description
General description
The JEOL JEM-F200 located in the Hilmer Building (E10) is high-resolution analytical (scanning) transmission electron microscope (S/TEM). This microscope has a high brightness cold-field emission gun capable of imaging atomic structures (HRTEM), electron diffraction and fast chemical elemental mapping using X-ray energy dispersive Spectroscopy (XEDS). Additionally, this microscope is specially configured for in-situ S/TEM imaging and 4D-STEM utilising our range of in-situ holders and high speed in-situ movie recording camera.
Hardware specifications
Electron Optics
- Electron Gun: cold field emission electron source
- Acceleration voltage: 200 kV, 80 kV
- Pole Piece: High Resolution (HR)
- Chromatic Aberration Cc: 1.4 mm
- Spherical Aberration, Cs: 1.0 mm
- Information limit: 0.11 nm
- STEM Resolution: 0.16 nm @ 200kV
Cameras and Detectors
- Gatan OneView with IS upgrade (4kx4k; 25 fps)
- Gatan Metro IS (2kx2k; 40 fps)
- Gatan Digiscan 3 (Model: 888) with STEMx
- JEOL STEM detectors: Bright field, Annular dark field
- 100 mm2 JEOL X-ray Energy Dispersive Spectrometers (XEDS) with a total collection area of 1 sr
Sample Holders
- JEOL Low Background Double Tilt Holders
- JEOL Single Tilt Holders
- JEOL High Tilt Holders (± 80°) (for Tomography)
- Hummingbird 9 contact Heating and Biasing
- Hummingbird Liquid Flow cell
- Hummingbird Gas heating holder
- Protochips Atmosphere in-situ holder
- Simple Origin cryo-transfer holder
- Fischione Gas/Vacuum transfer holder
Software specifications
Acquisition Software:
- JEOL TEM Centre
- Gatan Digital Micrograph v3.62
- Thermo Fisher Pathfinder v1.48
Supporting equipment
Sample Preparation:
- Henniker O2/Ar plasma cleaner
- JEOL JII-29080DMS Dry pumping station.
Data Analysis:
- Offline analysis servers with Gatan Digital Micrograph > v3.34.
Access rights
The EMU offers training, service, and collaboration for students, researchers, and industry professionals.
To begin using our facilities, please complete the enquiry form on the EMU website for general inquiries, training requests, or collaboration opportunities.
Acknowledgement
To acknowledge the use of this instrument in your publication, please copy and paste the following text into the acknowledgements section.
“The authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.”
Instrument Type(s)
- Transmission Electron Microscope